Constant Evolution of the International System of Units

Venue: PARKROYAL on Beach Road, Grand Ballroom, Singapore 199591

The A*STAR National Metrology Centre (NMC), Health Sciences Authority (HSA), and Testing, Inspection and Certification (TIC) Interest Group under Singapore Manufacturing Federation (SMF) are jointly organising a conference on “Constant Evolution of the International System of Units”, in conjunction with World Metrology Day.

The World Metrology Day marks the founding of the Metre Convention by seventeen nations on 20 May 1875. The Convention sets the framework for global collaboration in the science of measurement and the uniformity of measurement in commercial and industrial applications.


Keynote Speakers

“The SI Units, Constants and Change”
This November, the General Conference on Weights and Measures is expected to agree on one of the largest changes to the International System of Units (the SI) since its inception. Dr Liew, Member of International Committee of Weights and Measures (CIPM), will be sharing on the new definition of the SI units, the linked laws of physics and future development of metrology.

Dr Thomas LIEW, Executive Director,
National Metrology Centre

“Impact of Cybersecurity on Healthcare Information Resilience”

Healthcare organizations face an array of cybersecurity risks and threats.  These include untargeted and targeted attacks with increasing sophistication of vectors. Dr Graham will be sharing on the risks for healthcare organizations and consumers, and impact of cybersecurity on healthcare information resilience.

Dr Graham Gee, Client Manager/Trainer,
British Standards Institution (BSI Group


Programme at a glance

Plenary Session, Morning

Invited speakers will share the latest developments in metrology, testing and standards, and their impacts to the stakeholders of the metrology system which includes the metrology laboratories, regulators and the TIC industries. Topics which will be covered include:

  • The SI Units, Constants and Change
  • Measurement of Safety Integrity of E/E/PES (Electrical/Electronic/Programmable Electronic Safety-related Systems) according to IEC61508
    Impact of Measurement Standard Development to Industry
  • Quality Assurance Through Accuracy-Based Proficiency Testing Programmes
  • Impact of Cybersecurity on Healthcare Information Resilience

Industry Engagement Sessions, Afternoon

The session will provide close interactions with domain experts on targeted topics on the following:

  • Session 1 : Advanced Measurement for Industrial Applications
  • Session 2: Measurement for Modern Manufacturing


Advanced measurement instrumentation and technologies for industry sectors will be showcased at the event. 

Registration is free and will be based on first-come-first-served. Click here to find out more about the event and register for your attendance by 30 April 2018 (the date inclusive).